Radioelektronikos terminų žodynas. – Vilnius : BĮ UAB „Litimo“. Kazimieras Gaivenis, Gytis Juška, Vidas Kalesinskas. 2000.
Optical beam induced current — (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the… … Wikipedia
défaut créé par radiation laser — lazerio spinduliuotės sukeltas defektas statusas T sritis radioelektronika atitikmenys: angl. laser beam induced defect vok. durch Laserstrahlen verursachter Fehler, m rus. дефект, вызванный лазерным излучением, m pranc. défaut créé par radiation … Radioelektronikos terminų žodynas
Laser — For other uses, see Laser (disambiguation). United States Air Force laser experiment … Wikipedia
Thermal laser stimulation — represents a class of defect imaging techniques which employ a laser to produce a thermal variation in a semiconductor device. [Harvnb|Beaudoin|Desplats|Perdue|Boit|2004] This technique may be used for semiconductor failure analysis. There are… … Wikipedia
Light induced voltage alteration — (LIVA) is a semiconductor analysis technique that uses a laser or infrared light source to induce voltage changes in a device while scanning the beam of light across its surface. The technique relies upon the generation of electron hole pairs in… … Wikipedia
durch Laserstrahlen verursachter Fehler — lazerio spinduliuotės sukeltas defektas statusas T sritis radioelektronika atitikmenys: angl. laser beam induced defect vok. durch Laserstrahlen verursachter Fehler, m rus. дефект, вызванный лазерным излучением, m pranc. défaut créé par radiation … Radioelektronikos terminų žodynas
lazerio spinduliuotės sukeltas defektas — statusas T sritis radioelektronika atitikmenys: angl. laser beam induced defect vok. durch Laserstrahlen verursachter Fehler, m rus. дефект, вызванный лазерным излучением, m pranc. défaut créé par radiation laser, m … Radioelektronikos terminų žodynas
дефект, вызванный лазерным излучением — lazerio spinduliuotės sukeltas defektas statusas T sritis radioelektronika atitikmenys: angl. laser beam induced defect vok. durch Laserstrahlen verursachter Fehler, m rus. дефект, вызванный лазерным излучением, m pranc. défaut créé par radiation … Radioelektronikos terminų žodynas
radiation — radiational, adj. /ray dee ay sheuhn/, n. 1. Physics. a. the process in which energy is emitted as particles or waves. b. the complete process in which energy is emitted by one body, transmitted through an intervening medium or space, and… … Universalium
Failure analysis — is the process of collecting and analyzing data to determine the cause of a failure. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of… … Wikipedia
